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Raman Scattering Study of PEDOT: PSS/Ge Composite films

Authors

Sharad Tripathi

Department of Physics, Guru Nanak Khalsa College of Arts, Science & Commerce (Autonomous), Matunga, Mumbai, India. (India)

Article Information

DOI: 10.51584/IJRIAS.2026.11090068

Subject Category: material science

Volume/Issue: 11/9 | Page No: 923-925

Publication Timeline

Submitted: 2026-09-22

Accepted: 2026-09-28

Published: 2026-10-12

Abstract

Abstract: Cleaned surface of spin coated of PEDOT: PSS on quartz glass was deposited by thin films of Germanium (Ge) on it using vacuum deposition technique. Thin films of Germanium (Ge) of thickness 50 nm, 75 nm and 100 nm were deposited by electron beam gun evaporation system. The prepared composite thin films were characterized for its surface and structural properties by using Raman scattering spectroscopy. Clusters of different sizes with surface roughness are seen due to deposition of Ge thin film layers and also showed multiple peaks and amorphous nature. Different Grain size of clusters is also found non-uniform in all deposited films.

Keywords

Keywords: Germanium (Ge), Thin Films, Raman spectroscopy.

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References

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