Optical Property of Fe+2 Ions implanted Silicon Substrate

Chemically cleaned Semiconductor thin films of silicon (Si) were implanted with 200 keV Fe+2 ions with various fluences and characterized by using Fourier Transform Infrared Spectroscopy. The decrease in transmittance is due to mixing of iron ions near to surface of silicon samples layer which is less transparent as compared to virgin sample and also revealed the different sizes of clusters formed in samples.

Silicon (Si), Fe+2 ion, implantation, FTIR spectroscopy

1. Jai Prakash, Tripathi A., Rigato V., Pivin J. C.Tripathi1 Jala et al, J.Physics D:Appl. Phys.,44,125302 (2011) [Google Scholar] [Crossref]

2. Jai Prakash, Tripathi A., Lakshmi G. B. V. S., Rigato V., Tripathi1 Jalaj, Avasthi D. K. Adv. Mat. Lett., [Google Scholar] [Crossref]

3. 4(6), 408 (2013). Martin N.,Serruys Y., Nucl. Inst. And meth. B, 105,175, (1995). [Google Scholar] [Crossref]

4. Zhou X., Wei Q., Sun K., Wang L., Appl. Phys.lett. , 94,133197, (2009) [Google Scholar] [Crossref]

• Factors Responsible for End-User Preference for Imported Ceramic Sanitary Ware in Ogun State, Nigeria
• Exploring the Potentials of Ibule-Soro Clay for the Formulating of Mid-Temperature Decorative Slip Glazes
• Development and Characterization of a Sustainable Pectin-Based Zeolite–Zno Hybrid Nanocomposite for Antibacterial Biomedical Applications
• Heat Treatment Analysis on Microstructure and Mechanical Properties of Thixoformed Aluminium Alloys
• Comparative Structural, Phase Evolution, and Spectroscopic Investigation of Binary and Ternary Mixed Metal Oxide Nanoparticles (Co-Cu, Co-Ni, Ni-Fe, And Co-Ni-Zn) Synthesized Via Grape Leaf Powder Calcination